Apparatus for improving stability and lock time for synchronous circuits

ABSTRACT

Delay-locked loops, signal locking methods and devices and system incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the test signal into the forward delay path and measures the time of traversal of the test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector&#39;s update period. The phase detector is thereafter able to stabilize at an improved rate.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of application Ser. No. 11/028,090,filed Jan. 3, 2005, pending, which is a continuation of application Ser.No. 10/425,069, filed Apr. 28, 2003, now U.S. Pat. No. 6,839,301, issuedJan. 4, 2005.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates generally to memory devices and, moreparticularly, to memory devices adapted to receive input data andprovide output data synchronized with a common external clock signal.

2. State of the Art

Integrated circuits, including memory and processors, which operate insynchronization with an external clock signal, typically generate aninternal clock signal for gating the rippling nature of logic and forstaging synchronous steps. Because of the inherent latencies associatedwith successive levels of propagation, the internal clock signal may bedelayed when compared with the external clock signal. Such a delay maycause deterioration in the performance of the device duringhigh-frequency operation. For example, during operation at highfrequencies, the access time (i.e., the time required for outputtingdata after receipt of an external clock signal) may become longer thanthe time required for generating an internal clock signal from thereceived external clock signal.

Approaches have been explored for reducing the deterioration of theperformance of a memory device at higher frequencies, one of whichapproach includes synchronizing the internal clock signal with theexternal clock signal. One synchronization implementation includes adelay locked loop (DLL) which is used as an internal clock signalgenerator. DLLs use an adjustable delay line comprised of a series ofconnectable delay elements. Digital information is used to eitherinclude or exclude a certain number of delay elements within a delayline. In a conventional DLL, a clock input buffer accepts a clock inputsignal and transmits the signal to one or more delay lines of delayelements. The delay of the delay path is increased from a minimumsetting until the edge of the delayed reference clock is eventuallytime-shifted just past the next corresponding edge of the referenceclock. As an element of a conventional DLL, a digital phase detectorcontrols the delay line propagation delay so that the delayed clockremains synchronized with the external or reference clock.

Conventional DLLs suffer from numerous drawbacks. Loop stability andlock time are very important parameters for DLLs. In order to acquire aquick lock, the phase detector has to update as soon as possible. On theother hand, noise and long loop intrinsic delay require filtering toslow down the update rate due to desirable loop stability.Traditionally, the DLLs preferably operate within a wide frequency rangeand the loop time delay is dictated by the highest frequency. In short,the loop time delay is translated to be the number of clock cycles thephase detector waits until the next comparison. Under process, voltage,and temperature variations, the response time could be two cycles forlow-speed operation and ten or more cycles for high-speed operation.

A need, therefore, exists to improve the performance of DLLs andovercome, or at least reduce, one or more of the problems set forthabove.

BRIEF SUMMARY OF THE INVENTION

The present invention is directed at a circuit and method to implement adelay-locked loop for adjusting the phase of an internal clock signal onan integrated circuit to align with the phase of an external clocksignal. In one embodiment, a delay-locked loop includes a forward delaypath, a feedback delay path, a phase detector and a timer circuit. Theforward delay path includes a clock input path and a delay line. Theclock input path alternatively couples to the external clock signal andto an internal test signal. The delay line introduces adjustable delayinto the internal clock signal for aligning the phase. The feedbackdelay path includes one or more delay models and generates a feedbacksignal to the phase detector. The phase detector adjusts the delay linebased upon the phase differences of the feedback signal and the externalclock signal. The timer circuit switches the test signal into theforward delay path and measures the time of traversal of the test signalaround the forward delay path and the feedback delay path and generatesa time constant for configuring the phase detector's update period. Thephase detector is thereafter able to stabilize at an improved rate.

In another embodiment, the delay-locked loop is incorporated into amemory device including a memory array. The memory array latchesretrieved data external to the memory device based upon an internalclock signal that undergoes phase adjustment according to thedelay-locked loop. A further embodiment integrates the memory deviceinto an electronic system.

Yet another embodiment includes a method for locking an internal clocksignal with an external clock signal. An external signal is input into aforward loop path while initialization of a phase detector occurs. Atest signal is switched into the forward loop path and timed duringtraversal of the forward and feedback loop paths. Based upon thetraversal time of the test signal, the phase detector is configured toupdate the delay line at intervals that improve the lock time andimprove stability of the phase detector.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

In the drawings, which illustrate what is currently considered to be thebest mode for carrying out the invention:

FIG. 1 is a system diagram of an electronic system, in accordance withan embodiment of the present invention;

FIG. 2 is block diagram of a memory device including a DLL capable ofsynchronization with an external input clock signal, in accordance withan embodiment of the present invention;

FIG. 3 is a flowchart illustrating an initialization of the DLL prior toidentifying the DLL loop delay, in accordance with an embodiment of thepresent invention;

FIGS. 4A and 4B are flowcharts illustrating the identification of theDLL loop delay, in accordance with an embodiment of the presentinvention; and

FIG. 5 is a timing diagram illustrating signal relationships of the DLLof FIG. 2.

DETAILED DESCRIPTION OF THE INVENTION

This disclosure describes prediction of an intrinsic DLL loop delaybefore starting and maintaining the synchronization. Generally, the DLLloop delay after lock is an integer number, n, of clock cycles.Generally, the DLL loop delay may include delay lines (e.g., fine,coarse, spare, etc.), clock distribution networks, clock drivers andbuffers, and input/output (I/O) delays.

In synchronous dynamic random access memory, the data out latch strobeor clock should be locked or maintain a fixed relationship to theexternal clock for high-speed performance. The clock-access andoutput-hold times are determined by the delay time of the internalcircuits. Referring to FIG. 1, a simplified block diagram of anexemplary electronic system 10 (e.g., a computer system) is provided.The electronic system 10 includes a processor 12 coupled to a host bus14. A memory controller 16 is coupled to both the host bus 14 and amemory device 18. A host bridge 20 couples the host bus 14 to an I/O bus22 (e.g., a Peripheral Component Interconnect (PCI) bus). One or moreinput devices 24 couple to the I/O bus 22. Similarly, one or more outputdevices 26 couple to the I/O bus 22.

The processor 12 communicates with the memory device 18 through thememory controller 16. The memory controller 16 provides memory addressesand logic signals to the memory device 18 to characterize the desiredmemory transactions. In the illustrated embodiment, the memory device 18is a synchronous memory device such as a Synchronous Dynamic RandomAccess Memory (SDRAM). Although the present invention is described inreference to an SDRAM, its application is not so limited. In light ofthe disclosure herein, the present invention may be adapted for use withother types of memory devices (not shown).

FIG. 2 illustrates a simplified block diagram of a memory device 18, inaccordance with an exemplary embodiment of the present invention.Referring to FIG. 2, memory device 18 includes a memory core or memoryarray 28 for storing addressable data therein. Memory array 28 mayfurther include pipelines or buffers for staging the delivery of data toa data output latch 30. Pipelining elements are representative of thecharacteristic delay of the device which is consistent with synchronousmemory technologies. Staging or pipelining of data in synchronousmemories is understood by those of ordinary skill in the art and is,therefore, not further described herein.

The memory device 18 further includes a Delay-Locked Loop (DLL) 32implemented to predict the loop delay of a clock signal within memorydevice 18 and for providing the clock signal to the data output latch30. DLL 32 includes a clock input path 34 for receiving an externalclock signal XCLK. The external clock signal XCLK may originate from amemory controller 16 (FIG. 1) or may be generated independently by aclock generator (not shown) of electronic system 10 (FIG. 1). Theexternal clock signal XCLK couples to an input of a clock buffer 36. Theinternal clock signal INTCLK is coupled to a clock stopping multiplexer38 which multiplexes either the internal clock signal INTCLK or the testpattern signal or modulated-derivative of the clock signal TEST utilizedduring the calculation of the intrinsic delay path which is furtherdescribed below. The clock stopping multiplexer 38 alternates the outputbased upon a control signal STOP received from a timer circuit 40,further described below.

The DLL 32 further includes a delay line 42 for receiving a signalDLLREF from the clock input path 34 and for generating a delay lineoutput signal DLLOUT. The delay line 42 is configured to makeadjustments to the loop delay by inserting or bypassing propagationdelay elements within delay line 42. Those of ordinary skill in the artappreciate that delay line 42 inserts the desired delay into theclocking loop of the memory device such that the internal clock, asdelayed by delay line 42, results in a synchronous output of data withthe external clock signal XCLK.

Delay line 42 operates in conjunction with a phase detector 46 whichgenerates an output based upon the difference of the input signals. Whenthe difference between the input signals at phase detector 46 varies,phase detector 46 provides adjustments to delay line 42 in an attempt toarrive at a zero-phase differential between the input signals presentedat the inputs of phase detector 46. Delay line 42 is exemplarilyimplemented as a digital DLL which includes a shift register 50 which,in the exemplary embodiment, is implemented such that the location of abit within the shift register indicates the location for the coupling ofthe reference signal DLLREF, resulting in a determination of the amountof delay inserted by delay line 42. Delay line 42 further includes oneor more delay arrays 52 which correspond to the implementation of one ormore delay lines or paths within delay line 42. Delay line 42 may beimplemented as a Synchronous Mirror Delay (SMD)-type or, alternatively,may be implemented as multiple independent delay lines within delay line42. Additional implementations of alternative delay lines are alsocontemplated within the scope of the present invention. For example, inaddition to independent multiple delay lines and SMD-type delays, othermore traditional implementations including NAND delays and analog delayelements are also contemplated.

The delay line 42, in an exemplary embodiment, is comprised of one ormore delay lines, one of which may be used during an initialization modeand is configured as an SMD-type delay. Such a configuration utilizestwo delay lines and attempts to arrive at a fast initial lock. To do so,the SMD configuration measures the difference in phase to save timeduring the initialization.

Memory device 18 further includes a clock distribution network 44coupled to DLL 32 by way of a DLL output signal DLLOUT. Clockdistribution network 44 facilitates a uniform distribution or fanout toeach of the outputs located within a specific memory device. One suchspecific output from clock distribution network 44 is illustrated asDATAOUTCLK, which provides a latching or strobing clock signal to a dataoutput latch 30. Data output latch 30 couples to memory array 28 andgenerates an output signal that further couples to a DQ driver 54 whileultimately generating an output signal of memory device 18, illustratedas DATA OUT.

Memory device 18 further includes an I/O model 48 which couples theclock distribution network 44 with the phase detector 46 of DLL 32. I/Omodel 48 may be placed in the feedback loop path to provide anapproximation of actual delays that occur in the input clock path andoutput data path between the external clock signal XCLK and the dataoutput latch clocking signal DATAOUT CLK. By way of example and notlimitation, I/O model 48 includes delay models for clock input path 34illustrated as clock input path delay model 56 and a delay modelcharacterizing the driver delay associated with data output latch 30 andDQ driver 54, illustrated as DQ driver delay model 58. While otheractual delay representations may also be included within I/O model 48,delay models 56 and 58 are representative of those paths whichcontribute more significantly to the actual input clock path and outputdata path delay. I/O model 48 generates an output signal FEEDBACK whichcouples to an input of the phase detector 46.

While the phase detector 46 has generally been described with regard toits relationship to other elements of DLL 32, the phase detector 46 ofthe present invention includes internal functionality responsive tocontrol signals and further generates output signals which identify aspecific operational status of the phase detector 46. For example, phasedetector 46, in addition to generating a phase differential outputsignal DELAY CONTROL, also generates an output signal LOCK identifying aphase-locked state wherein the inputs provided to phase detector 46,namely DLLREF and FEEDBACK, are in phase. Furthermore, control signalsprovided to phase detector 46 include a signal STOP causing the phasedetector 46 to suspend any further adaptation of its phase differentialoutput signal DELAY CONTROL in response to any phase differential of theinput signals to the phase detector 46. Additionally, phase detector 46receives an OFFSET signal identifying a quantity of entire clock cyclesof delay through the forward loop path of the external clock XCLK withinmemory device 18. A RESET signal also couples with phase detector 46causing the phase detector 46 to suspend any further processing.

The DLL 32 of the present invention further includes a timer circuit 40coupled to both the clock input path 34 and the phase detector 46. Whilethe specific operation of timer circuit 40 will be described withreference to the functional flowchart of FIG. 3, timer circuit 40generally functions as a control circuit for inserting a test signalinto the forward loop path and timing the propagation of the test signalthrough both the forward loop path and the feedback loop path of the DLL32. By timing an actual inserted test signal, timer circuit 40 maydetermine an actual quantity of clock cycles required for propagatingthe external clock signal through the memory device and thereby providean accurate reading to the phase detector 46 for optimization ofsampling rates including the update rate associated with the generationof a phase differential signal DELAY CONTROL to delay line 42, thusimproving the stability and overall performance of the DLL 32 withinmemory device 18.

FIGS. 3, 4A and 4B are flowcharts illustrating the functionality oftimer circuit 40 in accordance with an exemplary embodiment of thepresent invention. Upon startup, timer circuit 40 enters into aninitialization mode 60 followed by a subsequent test mode 72, describedin detail in FIGS. 4A and 4B. During initialization mode 60, memorydevice 18 may be held in a reset state by a provided RESET signal. Whenthe reset signal is deasserted 62, an initialization counter 66 withintimer circuit 40 (FIG. 2) begins counting 64. Initialization counter 66is driven by the external clock signal XCLK, which incrementsinitialization counter 66. Logic within timer circuit 40 (FIG. 2) readsor evaluates 68 the initialization counter count and compares ordetermines 70 if the initialization counter count is equivalent to apredetermined phase detector initialization delay of sufficient durationto allow phase detector 46 to obtain a lock state or to obtain at leastan adequate or near-lock state. As described above, phase detector 46(FIG. 2) generates a signal DELAY CONTROL which adjusts the delaythrough delay line 42 (FIG. 2). During the present initialization mode,one alternative for generating an initial lock or an initial estimatefor delay line 42 utilizes an SMD delay line allowing phase detector 46by way of the forward delay path and the feedback delay path to assumean initial state.

Following initialization mode 60, timer circuit 40 (FIG. 2) transitionsinto a test mode 72, which generally measures the traversal time of aTEST signal through both the forward delay path and the feedback delaypath as measured against the current external XCLK and under currentenvironmental factors. Specifically, timer circuit 40 (FIG. 2) asserts74 a signal STOP which suspends 76 the phase detector 46 (FIG. 2) frommaking further adjustments to delay line 42 (FIG. 2). Additionally, theassertion of the signal STOP switches 78 the clock input path 34 (FIG.2) from the external clock signal XCLK to a test signal TEST initiatedby timer circuit 40 (FIG. 2). As described above, multiplexer 38 (FIG.2) switches the respective input signals to the output signal asdirected by the signal STOP.

The initialization counter 66 is compared or read 80 to determine 82 ifan adequate amount of time has lapsed to allow all external clocksignals XCLK to be flushed from the forward and feedback paths.Following the flushing of the external clock signal XCLK, a TEST signalis generated 84 which may assume the form of a single pulse or anidentified pulse pattern capable of being detected by timer circuit 40(FIG. 2). Additionally, a forward delay counter 86 is started 88 tomonitor the number of external clock signals XCLK that occur during thepropagation of the signal TEST through both the forward and feedbackpaths. When timer circuit 40 (FIG. 2) detects 90 the signal TEST as thesignal FEEDBACK, the forward delay counter count is retained or read 92and is assigned 94 as the OFFSET for updating 96 the phase detectorsampling and refresh rates within phase detector 46. The signal STOP isdeasserted 98 and the test mode terminates with the clock input path 34(FIG. 2) reverting back to receiving the external clock signal XCLK. Inaddition, phase detector 46 (FIG. 2) resumes comparing the phasedifference between the DLLREF and FEEDBACK signals. In response to thephase differential, and in accordance with the newly derived offsetdelay path parameters, phase detector 46 resumes continuous fine tuningof an operational delay path within delay line 42. Optionally, followingthe deassertion 98 of the STOP signal, a final test mode of FIG. 4Bdetermines 99 if a final lock is performed on the DLL. When the finallock is completed, then the timer circuit 40 is RESET 101 and the testmode is repeated, which results in the DLL entering the operationalmode.

FIG. 5 is a timing diagram with waveforms of the inputs and output ofthe phase detector 46 (FIG. 2). The timing diagram illustrates the clockinput signal DLLREF lagging the output clock signal FEEDBACK. In thiscase, in order for both signals to be synchronized, the amount of delayapplied to the input signal DLLREF must be increased. Since anembodiment of the present invention finds application to high clock ratedevices, multiple clock cycles may occur during the propagation of aclock cycle around the forward loop path (i.e., clock input path 34,delay line 42, and clock distribution network 44) as well as thefeedback path through the I/O model 48, all of FIG. 2. The processdescribed with reference to FIGS. 3, 4A and 4B details an approach foraccurately determining the number of clock cycles of delay around theDLL loop (i.e., forward loop path and feedback path).

During a time t₁, the phase detector 46 determines the error between theinput signals and generates an output signal DELAY CONTROL at time t₄directing the shift register 50 to shift the point of entry to the leftto increase the delay amount. In accordance with an embodiment of thepresent invention, the phase detector 46 then awaits the DLL loop delayperiod t₃ which was derived above as the signal OFFSET. During a timet₄, the phase detector 46 performs a subsequent comparison to continueto maintain or obtain lock between the input and output clocks. Itshould be appreciated that the locking approach described hereinimproves the lock time, in part, by identifying the number of clockcycles required for any modification to the input clock to propagatethrough the entire DLL delay loop and be observed at the inputs of thephase detector. By allowing delay adjustments as soon as the results areobserved allows subsequent changes to the delay line to be made as soonas possible. Such an optimized update approach provides for improvementto the locking time over static approaches. Additionally, by allowingdelay line changes only after the propagation of a previous changethrough the entire DLL delay loop, stability is improved by preventingringing and overshoot as well as by providing noise immunity totransient variations in voltage.

Generally, the DLL loop delay includes a clock input buffer, DLL forwarddelay through the delay line, clock distribution network, and I/O modelin the feedback path. The delay may vary in clock cycles, depending onthe process, voltage, temperature, and frequency. The phase detector maymake a wrong decision if the adjustment isn't fed back, resulting in anunstable loop response. The time, normally measured in clock cycles, thephase detector has to wait determines the loop stability and lock time.For a given process and operating frequency, the DLL loop delay can bedetermined during the initialization and doesn't change dramaticallyover voltage and temperature variations. Therefore, measuring the loopdelay to set up the cut-off frequency of the phase detector improves thestability and locking time regardless of the clock cycle time.

Although the foregoing description contains many specifics, these shouldnot be construed as limiting the scope of the present invention, butmerely as providing illustrations of some exemplary embodiments.Similarly, other embodiments of the invention may be devised which donot depart from the spirit or scope of the present invention. Featuresfrom different embodiments may be employed in combination. The scope ofthe invention is, therefore, indicated and limited only by the appendedclaims and their legal equivalents, rather than by the foregoingdescription. All additions, deletions, and modifications to theinvention, as disclosed herein, which fall within the meaning and scopeof the claims are to be embraced thereby.

1. A signal locking method, comprising: modeling an output driver of adevice; traversing a test signal through a delay line and an I/O modelof the output driver; adjusting the delay line in response to a delay ofthe test signal through the delay line and the I/O model; and delayingan external clock to the output driver through the delay line asconfigured by the test signal.
 2. The signal locking method of claim 1,wherein traversing a test signal includes temporarily switching the testsignal into a forward loop path through the delay line and a feedbackloop path through the I/O model.
 3. The signal locking method of claim2, wherein adjusting the delay line further comprises timing the testsignal around the forward loop path and the feedback loop path.
 4. Thesignal locking method of claim 3, further comprising: initializing aphase detector with an approximate forward loop delay; and configuringthe phase detector responsive to a delay of the test signal traversingthe forward loop path and the feedback loop path.